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151
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ITC
1989
IEEE
15 years 10 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
182
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ICWE
2010
Springer
15 years 10 months ago
2010
Springer
Future Web applications will increasingly require real-time data from the physical world collected by a myriad of sensors and actuators. Currently, integration of such devices requ...
