2903 search results - page 534 / 581 » On the univalence of an integral operator |
152
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
150
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
165
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
145
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
143
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Temperature monitoring using thermal sensors is an essential tool for evaluating the thermal behavior and sustaining the reliable operation in high-performance and high-power syst...