2903 search results - page 243 / 581 » On the univalence of an integral operator |
202
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TCAD
2011
15 years 1 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
206
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CORR
2011
Springer
14 years 10 months ago
2011
Springer
There is an increasing need for automated support for humans monitoring the activity of distributed teams of cooperating agents, both human and machine. We characterize the domain...
220
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SIGMETRICS
2011
ACM
14 years 9 months ago
2011
ACM
Software bugs that occur in production are often difficult to reproduce in the lab due to subtle differences in the application environment and nondeterminism. To address this pr...
217
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DAC
2011
ACM
14 years 6 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
202
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FPGA
2012
ACM
14 years 2 months ago
2012
ACM
In floating-point datapaths synthesized on FPGAs, the shifters that perform mantissa alignment and normalization consume a disproportionate number of LUTs. Shifters are implemente...