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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 10 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
SIGGRAPH
1996
ACM
15 years 10 months ago
Consequences of Stratified Sampling in Graphics
Antialiased pixel values are often computed as the mean of N point samples. Using uniformly distributed random samples, the central limit theorem predicts a variance of the mean o...
Don P. Mitchell
COLING
2008
15 years 7 months ago
Unsupervised Induction of Labeled Parse Trees by Clustering with Syntactic Features
We present an algorithm for unsupervised induction of labeled parse trees. The algorithm has three stages: bracketing, initial labeling, and label clustering. Bracketing is done f...
Roi Reichart, Ari Rappoport
AAAI
2006
15 years 7 months ago
Multi-Conditional Learning: Generative/Discriminative Training for Clustering and Classification
This paper presents multi-conditional learning (MCL), a training criterion based on a product of multiple conditional likelihoods. When combining the traditional conditional proba...
Andrew McCallum, Chris Pal, Gregory Druck, Xuerui ...
EMNLP
2004
15 years 7 months ago
Active Learning and the Total Cost of Annotation
Active learning (AL) promises to reduce the cost of annotating labeled datasets for trainable human language technologies. Contrary to expectations, when creating labeled training...
Jason Baldridge, Miles Osborne