903 search results - page 105 / 181 » On the reduction of a random basis |
167
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GLVLSI
2007
IEEE
16 years 16 days ago
2007
IEEE
A special logic synthesis problem is considered for Boolean functions which have large don’t care sets and are irregular. Here, a function is considered as irregular if the inpu...
166
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IJCNN
2006
IEEE
16 years 7 days ago
2006
IEEE
—A new application of the NN ensemble approach is presented. It is applied to NN emulations of model physics in complex numerical climate models, and aimed at improving the accur...
190
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ATS
2005
IEEE
15 years 11 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
150
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CEC
2005
IEEE
15 years 11 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
164
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ESA
2004
Springer
15 years 11 months ago
2004
Springer
We obtain the following results related to dynamic versions of the shortest-paths problem: (i) Reductions that show that the incremental and decremental singlesource shortest-paths...