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TCAD
2002
135views more  TCAD 2002»
15 years 6 months ago
Area fill synthesis for uniform layout density
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
Yu Chen, Andrew B. Kahng, Gabriel Robins, Alexande...
SIGGRAPH
2010
ACM
15 years 5 months ago
Nonlinear disparity mapping for stereoscopic 3D
This paper addresses the problem of remapping the disparity range of stereoscopic images and video. Such operations are highly important for a variety of issues arising from the p...
Manuel Lang, Alexander Hornung, Oliver Wang, Steve...
PKDD
2010
Springer
212views Data Mining» more  PKDD 2010»
15 years 5 months ago
Cross Validation Framework to Choose amongst Models and Datasets for Transfer Learning
Abstract. One solution to the lack of label problem is to exploit transfer learning, whereby one acquires knowledge from source-domains to improve the learning performance in the t...
ErHeng Zhong, Wei Fan, Qiang Yang, Olivier Versche...
PAISI
2010
Springer
15 years 4 months ago
Efficient Privacy Preserving K-Means Clustering
Abstract. This paper introduces an efficient privacy-preserving protocol for distributed K-means clustering over an arbitrary partitioned data, shared among N parties. Clustering i...
Maneesh Upmanyu, Anoop M. Namboodiri, Kannan Srina...
ICDM
2009
IEEE
154views Data Mining» more  ICDM 2009»
15 years 4 months ago
GSML: A Unified Framework for Sparse Metric Learning
There has been significant recent interest in sparse metric learning (SML) in which we simultaneously learn both a good distance metric and a low-dimensional representation. Unfor...
Kaizhu Huang, Yiming Ying, Colin Campbell
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