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DSD
2007
IEEE
16 years 1 months ago
2007
IEEE
Programmable routing and logic in field-programmable gate arrays are implemented using nMOS pass transistors. Since the threshold voltage drop across an nMOS device degrades the ...
139
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DSN
2007
IEEE
16 years 1 months ago
2007
IEEE
165
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DSN
2007
IEEE
16 years 1 months ago
2007
IEEE
This paper concerns the validity of a widely used method for estimating the architecture-level mean time to failure (MTTF) due to soft errors. The method first calculates the fai...
164
Voted
DSN
2007
IEEE
16 years 1 months ago
2007
IEEE
Full duplication of an entire application (through spatial or temporal redundancy) would detect many errors that are benign to the application from the perspective of the end-user...