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176
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
217
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ABIALS
2008
Springer
16 years 1 months ago
2008
Springer
Abstract. We present a model of motor learning based on a combination of Operational Space Control and Optimal Control. Anticipatory processes are used both in the learning of the ...
226
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AH
2008
Springer
16 years 1 months ago
2008
Springer
Abstract. In this paper, we look at initial results of data mining students’ help-seeking behaviour in two ITSs: SQL-Tutor and EER-Tutor. We categorised help given by these tutor...