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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
167
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GLOBECOM
2008
IEEE
16 years 1 months ago
2008
IEEE
Abstract—Peer-to-Peer (P2P) file sharing applications use multiple TCP connections between peers to transfer data. The aggressiveness and robustness of P2P technology remarkably...
GLOBECOM
2008
IEEE
16 years 1 months ago
2008
IEEE
