20511 search results - page 138 / 4103 » On the level |
165
click to vote
DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
162
click to vote
DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
Although algorithm level re-computing techniques can trade-off the detection capability of Concurrent Error Detection (CED) vs. time overhead, it results in 100% time overhead whe...
192
click to vote
ECRTS
2002
IEEE
2002
IEEE
Managing Multi-Mode Tasks with Time Cost and Quality Levels using Optimal Discrete Control Synthesis
15 years 11 months ago
Real-time control systems are complex to design, and automation support is important. We are interested in systems with multiple tasks, each with multiple modes, implementing a fu...
242
click to vote
ICCAD
1999
IEEE
15 years 11 months ago
1999
IEEE
This paper presents a general method for computing transient sensitivities using both the direct and adjoint methods in event driven controlled explicit simulation algorithms that...
135
click to vote
ISCA
1998
IEEE
15 years 10 months ago
1998
IEEE
Much of the improvement in computer performance over the last twenty years has come from faster transistors and architectural advances that increase parallelism. Historically, par...