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CVPR
2000
IEEE
15 years 11 months ago
A Combined Feature-Texture Similarity Measure for Face Alignment under
We formulate face alignment as a model-based parameter estimation problem in this paper. First, we work within a framework that combines two separate subspace models to r epresent...
Lixin Fan, Kah Kay Sung
PAKDD
1998
ACM
103views Data Mining» more  PAKDD 1998»
15 years 11 months ago
Discovering Case Knowledge Using Data Mining
The use of Data Mining in removing current bottlenecks within Case-based Reasoning (CBR) systems is investigated along with the possible role of CBR in providing a knowledge manag...
Sarabjot S. Anand, David W. Patterson, John G. Hug...
RECOMB
1998
Springer
15 years 11 months ago
Alignments without low-scoring regions
Given a strong match between regions of two sequences, how far can the match be meaningfully extended if gaps are allowed in the resulting alignment? The aim is to avoid searching...
Zheng Zhang 0004, Piotr Berman, Webb Miller
CF
2007
ACM
15 years 10 months ago
Automated generation of layout and control for quantum circuits
We present a computer-aided design flow for quantum circuits, complete with automatic layout and control logic extraction. To motivate automated layout for quantum circuits, we in...
Mark Whitney, Nemanja Isailovic, Yatish Patel, Joh...
GLVLSI
2009
IEEE
128views VLSI» more  GLVLSI 2009»
15 years 10 months ago
Impact of lithography-friendly circuit layout
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
Pratik J. Shah, Jiang Hu