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156
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
Increasing complexity of the functionalities and the resultant growth in number of gates integrated in a chip coupled with shrinking geometries and short cycle time requirements br...
152
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ICCD
2007
IEEE
16 years 3 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
179
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for VLSI design. This paper,...
150
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TLDI
2009
ACM
16 years 3 months ago
2009
ACM
Object-oriented programs are notable for making use of both rder abstractions and mutable, aliased state. Either feature alone is challenging for formal verification, and the com...