Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
The strongest standard security notion for digital signature schemes is unforgeability under chosen message attacks. In practice, however, this notion can be insufficient due to â€...
Sebastian Faust, Eike Kiltz, Krzysztof Pietrzak, G...
We present a region-based active contour detection algorithm
for objects that exhibit relatively homogeneous photometric
characteristics (e.g. smooth color or gray levels),
embe...
Ganesh Sundaramoorthi, Stefano Soatto, Anthony Yez...
—While many-core accelerator architectures, such as today’s Graphics Processing Units (GPUs), offer orders of magnitude more raw computing power than contemporary CPUs, their m...
Aaron Ariel, Wilson W. L. Fung, Andrew E. Turner, ...