42507 search results - page 521 / 8502 » On the analysis of |
161
click to vote
ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
185
click to vote
ICCAD
2003
IEEE
16 years 4 months ago
2003
IEEE
This paper proposes a scheme that captures diverse input waveforms of CMOS gates for static timing analysis. Conventionally the latest arrival time and transition time are calcula...
167
Voted
ICCAD
2001
IEEE
16 years 4 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
209
click to vote
CVPR
2010
IEEE
16 years 3 months ago
2010
IEEE
Based on multifractal analysis in wavelet pyramids of texture images, a new texture descriptor is proposed in this paper that implicitly combines information from both spatial and...
223
click to vote
PERVASIVE
2010
Springer
16 years 2 months ago
2010
Springer
As sensing technologies become increasingly distributed and democratized, citizens and novice users are becoming responsible for the kinds of data collection and analysis that have...