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159
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MTDT
2003
IEEE
16 years 15 days ago
2003
IEEE
: Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characteri...
179
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SEFM
2003
IEEE
16 years 15 days ago
2003
IEEE
In this paper, we introduce a component-based design methodology and present a practical analysis approach that makes use of the modular nature of component-based designs to allev...
188
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DAWAK
2003
Springer
16 years 14 days ago
2003
Springer
Abstract In data clustering, many approaches have been proposed. For example, K-means method and hierarchical method. A problem is in effect by initial value and criterion to comb...
158
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ISMIS
2003
Springer
16 years 13 days ago
2003
Springer
Generalization of the fundamental rough set discernibility tools aiming at searching for relevant patterns for complex decisions is discussed. As an example of application, there i...
194
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NORDSEC
2009
Springer
15 years 11 months ago
2009
Springer
In this paper, we report the results of the formal analysis performed on the Estonian Mobile-ID protocol (deployed since 2008), allowing citizens and permanent residents of Estonia...