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ICCAD
2007
IEEE
135views Hardware» more  ICCAD 2007»
16 years 3 months ago
A selective pattern-compression scheme for power and test-data reduction
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
Chia-Yi Lin, Hung-Ming Chen
ICCAD
2007
IEEE
132views Hardware» more  ICCAD 2007»
16 years 3 months ago
Principle Hessian direction based parameter reduction with process variation
— As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. In this paper, we propose a Principle Hessi...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
ICCAD
2004
IEEE
85views Hardware» more  ICCAD 2004»
16 years 3 months ago
Improving soft-error tolerance of FPGA configuration bits
Soft errors that change configuration bits of an SRAM based FPGA modify the functionality of the design. The proliferation of FPGA devices in various critical applications makes it...
Suresh Srinivasan, Aman Gayasen, Narayanan Vijaykr...
ICCAD
2003
IEEE
140views Hardware» more  ICCAD 2003»
16 years 3 months ago
Fast Cycle-accurate Behavioral Simulation for Pipelined Processors Using Early Pipeline Evaluation
Modeling and simulating pipelined processors in procedural languages such as C/C++ requires lots of cost in handling concurrent events, which hinders fast simulation. A number of ...
In-Cheol Park, Se-Hyeon Kang, Yongseok Yi
ARITH
2009
IEEE
16 years 1 months ago
Advanced Clockgating Schemes for Fused-Multiply-Add-Type Floating-Point Units
The paper introduces fine-grain clockgating schemes for fused multiply-add-type floating-point units (FPU). The clockgating is based on instruction type, precision and operand v...
Jochen Preiss, Maarten Boersma, Silvia Melitta M&u...