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TASE
2011
IEEE
15 years 1 months ago
Multiclass Flow Line Models of Semiconductor Manufacturing Equipment for Fab-Level Simulation
—For multiclass flow line models, we identify a class of service times that allow a decomposition of the system into subsets of servers called channels. In each channel, the cus...
James R. Morrison
PROMISE
2010
15 years 1 months ago
Exploiting count spectra for Bayesian fault localization
Background: Automated diagnosis of software defects can drastically increase debugging efficiency, improving reliability and time-to-market. Current, low-cost, automatic fault dia...
Rui Abreu, Alberto González-Sanchez, Arjan ...
PVLDB
2010
139views more  PVLDB 2010»
15 years 1 months ago
Identifying the Most Influential Data Objects with Reverse Top-k Queries
Top-k queries are widely applied for retrieving a ranked set of the k most interesting objects based on the individual user preferences. As an example, in online marketplaces, cus...
Akrivi Vlachou, Christos Doulkeridis, Kjetil N&osl...
TSP
2010
15 years 1 months ago
Variance-component based sparse signal reconstruction and model selection
We propose a variance-component probabilistic model for sparse signal reconstruction and model selection. The measurements follow an underdetermined linear model, where the unknown...
Kun Qiu, Aleksandar Dogandzic
ML
2011
ACM
308views Machine Learning» more  ML 2011»
15 years 1 months ago
Relational information gain
Abstract. Type Extension Trees (TET) have been recently introduced as an expressive representation language allowing to encode complex combinatorial features of relational entities...
Marco Lippi, Manfred Jaeger, Paolo Frasconi, Andre...