1778 search results - page 93 / 356 » On the Power of the Randomized Iterate |
140
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ISVLSI
2008
IEEE
16 years 21 days ago
2008
IEEE
The share of leakage in cache power consumption increases with technology scaling. Choosing a higher threshold voltage (Vth) and/or gate-oxide thickness (Tox) for cache transistor...
170
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ISVLSI
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
152
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DAC
1995
ACM
15 years 10 months ago
1995
ACM
This paper describes a technique for calculating the switching activity of a set of registers shared by di erent data values. Based on the assumption that the joint pdf (probabili...
156
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WINET
2002
15 years 6 months ago
2002
We present a game-theoretic treatment of distributed power control in CDMA wireless systems. We make use of the conceptual framework of noncooperative game theory to obtain a distr...
153
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CEC
2005
IEEE
15 years 12 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...