—In this paper, we investigate the transmission completion time minimization problem in a two-user additive white Gaussian noise (AWGN) broadcast channel, where the transmitter i...
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
Connected world-widely distributed computers and data systems establish a global source of processing power and data, called a grid. Key properties of a grid are the fact that com...
PageRank is one of the principle criteria according to which Google ranks Web pages. PageRank can be interpreted as a frequency of Web page visits by a random surfer and thus it r...