Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
Ke Meng, Frank Huebbers, Russ Joseph, Yehea I. Ism...
Numerous recent papers have found important relationships between network structure and risks within networks. These results indicate that network structure can dramatically affec...
Paul Hines, Seth Blumsack, E. Cotilla Sanchez, C. ...
Power analysis has shown to be successful in breaking symmetric cryptographic algorithms implemented on low resource devices. Prompted by the breaking of many protected implementat...
Abstract— We study leakage-power reduction in standby random access memories (SRAMs) during data-retention. An SRAM cell requires a minimum critical supply voltage (DRV) above wh...
Animesh Kumar, Huifang Qin, Prakash Ishwar, Jan M....
Abstract— In [1], we have recently proposed a general approach for approximating the power sum of Log–Normal Random Variables (RVs) by using the Pearson system of distributions...
Marco Di Renzo, Fabio Graziosi, Fortunato Santucci