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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 10 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
CP
1997
Springer
15 years 10 months ago
Five Pitfalls of Empirical Scheduling Research
A number of pitfalls of empirical scheduling research are illustrated using real experimental data. These pitfalls, in general, serve to slow the progress of scheduling research b...
J. Christopher Beck, Andrew J. Davenport, Mark S. ...
ECP
1997
Springer
125views Robotics» more  ECP 1997»
15 years 10 months ago
Possibilistic Planning: Representation and Complexity
A possibilistic approach of planning under uncertainty has been developed recently. It applies to problems in which the initial state is partially known and the actions have graded...
Célia da Costa Pereira, Frédé...
IFL
1997
Springer
136views Formal Methods» more  IFL 1997»
15 years 10 months ago
Fully Persistent Graphs - Which One To Choose?
Functional programs, by nature, operate on functional, or persistent, data structures. Therefore, persistent graphs are a prerequisite to express functional graph algorithms. In th...
Martin Erwig
ICTAI
1993
IEEE
15 years 10 months ago
Robust Feature Selection Algorithms
Selecting a set of features which is optimal for a given task is a problem which plays an important role in a wide variety of contexts including pattern recognition, adaptive cont...
Haleh Vafaie, Kenneth DeJong