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168
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CEC
2005
IEEE
16 years 8 days ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
194
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ICAC
2005
IEEE
16 years 8 days ago
2005
IEEE
Large data centers host several application environments (AEs) that are subject to workloads whose intensity varies widely and unpredictably. Therefore, the servers of the data ce...
196
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ICIP
2005
IEEE
16 years 8 days ago
2005
IEEE
We propose a robust face alignment algorithm with a novel discriminative local texture model. Different from the conventional descriptive PCA local texture model in ASM, classifie...
178
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ICRA
2005
IEEE
16 years 7 days ago
2005
IEEE
— We present a semi-parametric control policy representation and use it to solve a series of nonholonomic control problems with input state spaces of up to 7 dimensions. A neares...
154
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ISCAS
2005
IEEE
16 years 7 days ago
2005
IEEE
In high-level synthesis, accurate lower-bound estimation is helpful to explore the search space efficiently and to evaluate the quality of heuristic algorithms. For the lower-bound...