9949 search results - page 1746 / 1990 » On the Network Complexity of Selection |
181
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VLSID
2009
IEEE
16 years 7 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
202
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HPCA
2009
IEEE
16 years 7 months ago
2009
IEEE
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make modern processors highly vulnerable to transient faults. Architectural Vulnerabil...
161
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KDD
2002
ACM
16 years 7 months ago
2002
ACM
In this paper, we propose a new approach to discover informative contents from a set of tabular documents (or Web pages) of a Web site. Our system, InfoDiscoverer, first partition...
202
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HPCA
2006
IEEE
16 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
171
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RECOMB
2002
Springer
16 years 7 months ago
2002
Springer
A recent idea for determining the three-dimensional structure of a protein uses antibody recognition of surface structure and random peptide libraries to map antibody epitope comb...