A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
The new Associative Language Description (ALD) model, a combination of locally testable and constituent structure ideas, is proposed, arguing that in practice it equals context-fr...
Abstract--In this paper, we present an efficient graph-based evolutionary optimization technique called evolutionary graph generation (EGG) and the proposed approach is applied to ...
This paper describes the dynamic control of a 3 degree of freedom (DOF) finger emulating a human finger for reaching a desired fingertip position in space. The control consists of ...
An approach is proposed for generating homogenous three-staged cutting patterns for the constrained two-dimensional guillotinecutting problems of rectangles. It is based on branch...