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TCAD
2008
114views more  TCAD 2008»
15 years 6 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
ICDE
2009
IEEE
155views Database» more  ICDE 2009»
16 years 1 months ago
Join Optimization of Information Extraction Output: Quality Matters!
— Information extraction (IE) systems are trained to extract specific relations from text databases. Real-world applications often require that the output of multiple IE systems...
Alpa Jain, Panagiotis G. Ipeirotis, AnHai Doan, Lu...
CODES
2007
IEEE
16 years 28 days ago
HySim: a fast simulation framework for embedded software development
Instruction Set Simulation (ISS) is widely used in system evaluation and software development for embedded processors. Despite the significant advancements in the ISS technology,...
Stefan Kraemer, Lei Gao, Jan Weinstock, Rainer Leu...
IPPS
2006
IEEE
16 years 18 days ago
A simulator for parallel applications with dynamically varying compute node allocation
Dynamically allocating computing nodes to parallel applications is a promising technique for improving the utilization of cluster resources. We introduce the concept of dynamic ef...
Basile Schaeli, B. Gerlach, Roger D. Hersch
SC
2004
ACM
16 years 3 hour ago
Language and Compiler Support for Adaptive Applications
There exist many application classes for which the users have significant flexibility in the quality of output they desire. At the same time, there are other constraints, such a...
Wei Du, Gagan Agrawal