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» On the Error Parameter of Dispersers
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ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
15 years 8 months ago
Handling partial correlations in yield prediction
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
Sridhar Varadan, Janet Meiling Wang, Jiang Hu
AIA
2007
15 years 7 months ago
Optimizing number of hidden neurons in neural networks
In this paper, a novel and effective criterion based on the estimation of the signal-to-noise-ratio figure (SNRF) is proposed to optimize the number of hidden neurons in neural ne...
Yue Liu, Janusz A. Starzyk, Zhen Zhu
EMNLP
2007
15 years 7 months ago
A Systematic Comparison of Training Criteria for Statistical Machine Translation
We address the problem of training the free parameters of a statistical machine translation system. We show significant improvements over a state-of-the-art minimum error rate tr...
Richard Zens, Sasa Hasan, Hermann Ney
EMNLP
2008
15 years 7 months ago
Unsupervised Multilingual Learning for POS Tagging
We demonstrate the effectiveness of multilingual learning for unsupervised part-of-speech tagging. The key hypothesis of multilingual learning is that by combining cues from multi...
Benjamin Snyder, Tahira Naseem, Jacob Eisenstein, ...
ICONIP
2008
15 years 7 months ago
The Diversity of Regression Ensembles Combining Bagging and Random Subspace Method
Abstract. The concept of Ensemble Learning has been shown to increase predictive power over single base learners. Given the bias-variancecovariance decomposition, diversity is char...
Alexandra Scherbart, Tim W. Nattkemper