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ISCAS
2011
IEEE
248views Hardware» more  ISCAS 2011»
14 years 10 months ago
SNR measurement based on linearity test for ADC BIST
—Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC’s SNR from its linearity test data. The method d...
Jingbo Duan, Degang Chen
DAC
2008
ACM
16 years 7 months ago
The design of a low power carbon nanotube chemical sensor system
This paper presents a hybrid CNT/CMOS chemical sensor system that comprises of a carbon nanotube sensor array and a CMOS interface chip. The full system, including the sensor, con...
Taeg Sang Cho, Kyeong-jae Lee, Jing Kong, Anantha ...
ICC
2007
IEEE
16 years 21 days ago
A Simple Power Margin Quality Measure for Correlated Random Variates Derived from the Normal Distribution
—This paper provides a power-margin-based measure of the quality of computer-generated random variates having a distribution that derives from the multivariate Gaussian distribut...
David J. Young, Norman C. Beaulieu
FOCS
2007
IEEE
15 years 10 months ago
Discrepancy and the Power of Bottom Fan-in in Depth-three Circuits
We develop a new technique of proving lower bounds for the randomized communication complexity of boolean functions in the multiparty `Number on the Forehead' model. Our meth...
Arkadev Chattopadhyay
CHES
2008
Springer
108views Cryptology» more  CHES 2008»
15 years 8 months ago
Exploiting the Power of GPUs for Asymmetric Cryptography
Modern Graphics Processing Units (GPU) have reached a dimension with respect to performance and gate count exceeding conventional Central Processing Units (CPU) by far. Many modern...
Robert Szerwinski, Tim Güneysu