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168
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FMSD
2006
15 years 6 months ago
2006
The design productivity gap has been recognized by the semiconductor industry as one of the major threats to the continued growth of system-on-chips and embedded systems. Ad-hoc sy...
180
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IJON
2008
15 years 6 months ago
2008
Convolutive mixtures of images are common in photography of semi-reflections. They also occur in microscopy and tomography. Their formation process involves focusing on an object ...
160
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JAIR
2008
15 years 6 months ago
2008
Model checking is a promising technology, which has been applied for verification of many hardware and software systems. In this paper, we introduce the concept of model update to...
177
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CORR
2007
Springer
15 years 6 months ago
2007
Springer
— The optimal decoder achieving the outage capacity under imperfect channel estimation is investigated. First, by searching into the family of nearest neighbor decoders, which ca...
169
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CORR
2007
Springer
15 years 6 months ago
2007
Springer
—The optimal decoder achieving the outage capacity under imperfect channel estimation is investigated. First, by searching into the family of nearest neighbor decoders, which can...