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ISSRE
2000
IEEE
15 years 11 months ago
How to Measure the Impact of Specific Development Practices on Fielded Defect Density
This author has mathematically correlated specific developmentpractices to defect density andprobability of on time delivev. Thispaper summarizes the results of this ongoing study...
Ann Marie Neufelder
MTDT
2000
IEEE
137views Hardware» more  MTDT 2000»
15 years 11 months ago
Diagnostic Testing of Embedded Memories Based on Output Tracing
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
SC
2000
ACM
15 years 11 months ago
Parallel Unsteady Turbo-Pump Simulations For Liquid Rocket Engines
This paper reports the progress being made towards complete turbo-pump simulation capability for liquid rocket engines. The Space Shuttle Main Engine (SSME) turbo-pump impeller is...
Cetin C. Kiris, Dochan Kwak, William Chan
ACSAC
1999
IEEE
15 years 11 months ago
Using Checkable Types in Automatic Protocol Analysis
The Automatic Authentication Protocol Analyzer, 2nd Version AAPA2 is a fast, completely automatic tool for formally analyzing cryptographic protocols. It correctly identi es vulne...
Stephen H. Brackin
ISWC
1999
IEEE
15 years 11 months ago
Non-Ideal Battery Properties and Low Power Operation in Wearable Computing
This paper describes non-ideal properties of batteries and how these properties may impact power-performance trade-offs in wearable computing. The first part of the paper details ...
Thomas L. Martin, Daniel P. Siewiorek