10718 search results - page 97 / 2144 » On the Circuit Implementation Problem |
170
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TAP
2010
Springer
15 years 11 months ago
2010
Springer
Abstract. We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than...
153
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ICCAD
1997
IEEE
15 years 10 months ago
1997
IEEE
Maximum instantaneous power in VLSI circuits has a great impact on circuit's reliability and the design of power and ground lines. To synthesizehighlyreliablesystems,accurate...
159
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ICCAD
1995
IEEE
15 years 10 months ago
1995
IEEE
This paper investigates the effect of the controller on the testability of sequential circuits composed of controllers and data paths. It is shown that even when both the controll...
149
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AICCSA
2006
IEEE
15 years 8 months ago
2006
IEEE
To excite a stuck-open fault in a CMOS combinational circuit, it is only necessary that the output of the gate containing the fault takes on opposite values during the application...
161
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DFT
2006
IEEE
15 years 10 months ago
2006
IEEE
The concept of clocking for QCA, referred to as the four-phase clocking, is widely used. However, inherited characteristics of QCA, such as the way to hold state, the way to synch...