10718 search results - page 665 / 2144 » On the Circuit Implementation Problem |
186
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CONSTRAINTS
2007
15 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
190
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JUCS
2007
15 years 7 months ago
2007
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
230
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JPDC
2000
15 years 7 months ago
2000
: SIMD arrays are likely to become increasingly important as coprocessors in domain specific systems as architects continue to leverage RAM technology in their design. The problem ...
249
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ICCAD
2009
IEEE
15 years 5 months ago
2009
IEEE
In a behavioral synthesis system, a typical approach used to guide the scheduler is to impose hard constraints on the relative timing between operations considering performance, a...
248
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TCAD
2010
15 years 2 months ago
2010
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...