Cross-trigger, the mechanism to trigger activities in one debug entity from debug events happened in another debug entity, is a very useful technique for debugging applications in...
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Processors progressively age during their service life due to normal workload activity. Such aging results in gradually slower circuits. Anticipating this fact, designers add timi...