Abstract. In this paper we present an eficient protocol for “Committed Oblivious Transfer” to perform oblivious transfer on committed bits: suppose Alice is committed to bits 0...
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper will outline practical techniques that are used to ...
Methodology, EDA Flow, scripts, and documentation plays a tremendous role in the deployment and standardization of advanced design techniques. In this paper we focus not only on l...
Philippe Royannez, Hugh Mair, Franck Dahan, Mike W...
Grid-warping is a recent placement strategy based on a novel physical analogy: rather than move the gates to optimize their location, it elastically deforms a model of the 2-D chi...