10718 search results - page 523 / 2144 » On the Circuit Implementation Problem |
203
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VLSID
2005
IEEE
16 years 20 days ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
191
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ASPDAC
2008
ACM
15 years 9 months ago
2008
ACM
Nowadays a placement problem often involves multi-million objects and excessive fixed blockages. We present a new global placement algorithm that scales well to the modern large-s...
213
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DAC
2005
ACM
15 years 9 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
211
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ICCAD
2010
IEEE
15 years 5 months ago
2010
IEEE
3D stacked circuits reduce communication delay in multicore system-on-chips (SoCs) and enable heterogeneous integration of cores, memories, sensors, and RF devices. However, vertic...
176
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ICCAD
2010
IEEE
15 years 5 months ago
2010
IEEE
With aggressive technology scaling, integrated circuits suffer from everincreasing wearout effects and their lifetime reliability has become a serious concern for the industry. Fo...