10718 search results - page 519 / 2144 » On the Circuit Implementation Problem |
195
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DSD
2010
IEEE
15 years 5 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
164
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JMLR
2010
15 years 1 months ago
2010
Logic-based probabilistic models (LBPMs) enable us to handle problems with uncertainty succinctly thanks to the expressive power of logic. However, most of LBPMs have restrictions...
217
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TCAD
2010
15 years 1 months ago
2010
Global routing for modern large-scale circuit designs has attracted much attention in the recent literature. Most of the state-of-the-art academic global routers just work on a sim...
189
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TE
2010
15 years 1 months ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
185
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ETS
2011
IEEE
14 years 6 months ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...