The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
This paper discusses the problem of increased programming time for intrinsic evolvable hardware (EHW) as the complexity of the circuit grows. We develop equations for the size of ...
We clarify the computational complexity of planarity testing, by showing that planarity testing is hard for L, and lies in SL. This nearly settles the question, since it is widely...
- It is important to model the substrate coupling for mixed-signal circuit designs today. This paper presents the direct boundary element method (BEM) for substrate resistance calc...
- We address the problem of implication of assertion graphs that occur in generalized symbolic trajectory evaluation (GSTE). GSTE has demonstrated its powerful capacity in formal v...
Guowu Yang, Jin Yang, William N. N. Hung, Xiaoyu S...