10718 search results - page 512 / 2144 » On the Circuit Implementation Problem |
164
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VTS
2003
IEEE
16 years 10 days ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
201
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DAC
2003
ACM
16 years 10 days ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
157
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ATS
2002
IEEE
16 years 1 days ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...
185
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ATS
2002
IEEE
16 years 1 days ago
2002
IEEE
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...
162
Voted
DFT
2002
IEEE
16 years 1 days ago
2002
IEEE
A novel approach for reducing power consumption in checkers used for concurrent error detection is presented. Spatial correlations between the outputs of the circuit that drives t...