10718 search results - page 506 / 2144 » On the Circuit Implementation Problem |
164
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DAC
2001
ACM
16 years 8 months ago
2001
ACM
We highlight several fundamental challenges to designing highperformance integrated circuits in nanometer-scale technologies (i.e. drawn feature sizes < 100 nm). Dynamic power ...
176
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VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
We consider the problem of minimizing the delay in signal transmission over point-to-point connections across multiple metal layers in a VLSI circuit. We present an exact solution...
153
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ICCD
2006
IEEE
16 years 4 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
171
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ICCD
2006
IEEE
16 years 4 months ago
2006
IEEE
—Soft error rates are an increasing problem in modern VLSI circuits. Commonly used error correcting codes reduce soft error rates in large memories and second level caches but ar...
166
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
We present the first efficient approach to global routing that takes spacing-dependent costs into account and provably finds a near-optimum solution including these costs. We sh...