10718 search results - page 462 / 2144 » On the Circuit Implementation Problem |
175
click to vote
DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
183
click to vote
EUROPAR
2004
Springer
15 years 10 months ago
2004
Springer
Abstract. Modern microprocessors have sacrificed the exactness of exceptions for improved performance long ago. This is a side effect of reordering instructions so that the micropr...
212
click to vote
DAC
2005
ACM
15 years 9 months ago
2005
ACM
On-chip supply networks are playing an increasingly important role for modern nanometer-scale designs. However, the ever growing sizes of power grids make the analysis problem ext...
195
click to vote
DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
Operating frequency of a pipelined circuit is determined by the delay of the slowest pipeline stage. However, under statistical delay variation in sub-100nm technology regime, the...
162
click to vote
RC
1998
15 years 6 months ago
1998
In computer and electronic manufacturing, it is very important to be able to automatically check whether the surface mounted devices (SMD) are correctly placed on the printed circ...