10718 search results - page 442 / 2144 » On the Circuit Implementation Problem |
166
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DAC
2006
ACM
16 years 28 days ago
2006
ACM
Silicon design implementation has become increasingly complex with the deep submicron technologies such as 90nm and below. It is common to see multiple processor cores, several ty...
185
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DAC
2006
ACM
16 years 28 days ago
2006
ACM
We present a novel application for carbon nanotube devices, implementing a high density 3-D capacitor, which can be useful for decoupling applications to reduce supply voltage var...
211
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DAC
2006
ACM
16 years 28 days ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
190
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DATE
2005
IEEE
16 years 17 days ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
189
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GLVLSI
2005
IEEE
16 years 17 days ago
2005
IEEE
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...