Current advances in chip design and manufacturing have allowed IC manufacturing to approach the nanometer range. As the feature size scales down, greater variability is experience...
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
One main challenge in building interpreters for hand-drawn sketches is the task of parsing a sketch to locate the individual symbols. Many existing pen-based systems avoid this pr...
Leslie Gennari, Levent Burak Kara, Thomas F. Staho...
—This paper addresses, from a probabilistic point of view, the issue of switching activity estimation in combinational circuits under the zero-delay model. As the main theoretica...
In this paper we formulate a power loading problem for the spatial subchannels (parallel channels) of a single-carrier MIMO-SVD system. The power loading solution is designed to mi...