10718 search results - page 307 / 2144 » On the Circuit Implementation Problem |
144
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
We demonstrate how to use placement to ameliorate the predicted repeater explosion problem caused by poor interconnect scaling. We achieve repeater count reduction by dynamically ...
146
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ICCD
2003
IEEE
16 years 3 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
172
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine...
219
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EVOW
1999
Springer
15 years 11 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
172
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ICCD
1996
IEEE
15 years 10 months ago
1996
IEEE
In general, automatic layout composition techniques based on pre-designed devices facilitate the production of small IC numbers by prefabricating their basic structures. They also...