6592 search results - page 1075 / 1319 » On robust cycle bases |
156
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
This paper proposes an innovative methodology to perform and validate a Failure Mode and Effects Analysis (FMEA) at System-on-Chip (SoC) level. This is done in compliance with the...
133
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Cost effective SOC test strongly hinges on parallel, independent test of SOC cores, which can only be ensured through proper core isolation techniques. While a core isolation mech...
167
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DDECS
2007
IEEE
16 years 1 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
172
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HICSS
2007
IEEE
16 years 1 months ago
2007
IEEE
This paper describes how the curriculum and course format at the Air Force Institute of Technology (AFIT) has evolved based on our experience with the highly-successful Cyber Defe...
179
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HICSS
2007
IEEE
16 years 1 months ago
2007
IEEE
— This paper demonstrates how two different sets of powerful domain specific language features can be specified and deployed as composable language extensions. These extensions...