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174
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DSN
2005
IEEE
16 years 4 days ago
2005
IEEE
Device scaling and large scale integration have led to growing concerns about soft errors in microprocessors. To date, in all but the most demanding applications, implementing par...
174
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EH
2005
IEEE
16 years 4 days ago
2005
IEEE
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...
164
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GLVLSI
2005
IEEE
16 years 3 days ago
2005
IEEE
We perform a detailed study of various crosstalk scenarios in VDSM technologies by using a distributed model of the crosstalk site and make a number of key observations about the ...
132
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ICDCS
2005
IEEE
16 years 3 days ago
2005
IEEE
We prove two theorems saying that no distributed system in which processes coordinate using reliable registers and -resilient services can solve the consensus problem in the prese...
154
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ICRA
2005
IEEE
16 years 3 days ago
2005
IEEE
- This work aims to demonstrate the feasibility of using Electro-Rheological Fluid (ERF) actuators in orthotics, creating a new breed of rehabilitation devices. ERFs are fluids tha...