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ITC
2000
IEEE
84views Hardware» more  ITC 2000»
15 years 10 months ago
Non-intrusive BIST for systems-on-a-chip
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
NIPS
2008
15 years 8 months ago
Domain Adaptation with Multiple Sources
This paper presents a theoretical analysis of the problem of domain adaptation with multiple sources. For each source domain, the distribution over the input points as well as a h...
Yishay Mansour, Mehryar Mohri, Afshin Rostamizadeh
NIPS
1992
15 years 7 months ago
Explanation-Based Neural Network Learning for Robot Control
How can artificial neural nets generalize better from fewer examples? In order to generalize successfully, neural network learning methods typically require large training data se...
Tom M. Mitchell, Sebastian Thrun
APVIS
2010
15 years 7 months ago
Volume visualization based on statistical transfer-function spaces
It is a difficult task to design transfer functions for noisy data. In traditional transfer-function spaces, data values of different materials overlap. In this paper we introduce...
Martin Haidacher, Daniel Patel, Stefan Bruckner, A...
ICML
2010
IEEE
15 years 7 months ago
Local Minima Embedding
Dimensionality reduction is a commonly used step in many algorithms for visualization, classification, clustering and modeling. Most dimensionality reduction algorithms find a low...
Minyoung Kim, Fernando De la Torre