2597 search results - page 404 / 520 » On numbers of Davenport-Schinzel sequences |
166
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ISCAS
1999
IEEE
15 years 10 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
147
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ICCAD
1998
IEEE
15 years 10 months ago
1998
IEEE
Due to the exponential growth of both design complexity and the number of gates per pin, functional debugging has emerged as a critical step in the development of a system-on-chip...
202
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LCTRTS
1999
Springer
15 years 10 months ago
1999
Springer
A Zero Overhead Loop Buffer (ZOLB) is an architectural feature that is commonly found in DSP processors. This buffer can be viewed as a compiler managed cache that contains a sequ...
163
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CONCUR
1998
Springer
15 years 10 months ago
1998
Springer
In this paper we solve the following problem: \given a digital circuit composed of gates whose real-valued delays are in an integerbounded interval, is there a way to discretize ti...
169
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GI
1998
Springer
15 years 10 months ago
1998
Springer
The IMB Jena Image Library of Biological Macromolecules (http://www.imb-jena.de/IMAGE.html) is a freely accessible Internet archive with three-dimensional (3D) structural informat...