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ICDM
2007
IEEE
132views Data Mining» more  ICDM 2007»
16 years 14 days ago
Error-Aware Density-Based Clustering of Imprecise Measurement Values
Manufacturing process development is under constant pressure to achieve a good yield for stable processes. The development of new technologies, especially in the field of photoma...
Dirk Habich, Peter Benjamin Volk, Wolfgang Lehner,...
APGV
2006
ACM
138views Visualization» more  APGV 2006»
15 years 8 months ago
Verification of rendering quality from measured BTFs
One of the most important, still unsolved problems in computer graphics is the generation of predictive imagery, i.e., images that represent perfect renditions of reality. Such pe...
Jan Meseth, Gero Müller, Reinhard Klein, Flor...
DIAL
2006
IEEE
146views Image Analysis» more  DIAL 2006»
15 years 8 months ago
Distance Measures for Layout-Based Document Image Retrieval
Most methods for document image retrieval rely solely on text information to find similar documents. This paper describes a way to use layout information for document image retrie...
Joost van Beusekom, Daniel Keysers, Faisal Shafait...
SDM
2009
SIAM
123views Data Mining» more  SDM 2009»
16 years 3 months ago
Measuring Discrimination in Socially-Sensitive Decision Records.
Discrimination in social sense (e.g., against minorities and disadvantaged groups) is the subject of many laws worldwide, and it has been extensively studied in the social and eco...
Dino Pedreschi, Franco Turini, Salvatore Ruggieri
ICCAD
2006
IEEE
116views Hardware» more  ICCAD 2006»
16 years 3 months ago
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
Erkan Acar, Sule Ozev, Kevin B. Redmond