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IOLTS
2008
IEEE
102views Hardware» more  IOLTS 2008»
16 years 1 months ago
Integrating Scan Design and Soft Error Correction in Low-Power Applications
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
Michael E. Imhof, Hans-Joachim Wunderlich, Christi...
KBSE
2008
IEEE
16 years 1 months ago
Random Test Run Length and Effectiveness
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
AAIM
2008
Springer
96views Algorithms» more  AAIM 2008»
16 years 1 months ago
Minimum Leaf Out-Branching Problems
Abstract. Given a digraph D, the Minimum Leaf Out-Branching problem (MinLOB) is the problem of finding in D an out-branching with the minimum possible number of leaves, i.e., vert...
Gregory Gutin, Igor Razgon, Eun Jung Kim
ACNS
2008
Springer
115views Cryptology» more  ACNS 2008»
16 years 1 months ago
The Security of EPC Gen2 Compliant RFID Protocols
The increased functionality of EPC Class1 Gen2 (EPCGen2) is making this standard the de facto specification for inexpensive tags in the RFID industry. EPCGen2 supports only very b...
Mike Burmester, Breno de Medeiros
ADHOCNOW
2008
Springer
16 years 1 months ago
Self-interference in Multi-hop Wireless Chains: Geometric Analysis and Performance Study
Abstract. In the presence of interference, two single hop links can interact in a number of different ways, exhibiting significantly different behavior. In this paper, we consid...
Saquib Razak, Nael B. Abu-Ghazaleh