3244 search results - page 375 / 649 » On convex complexity measures |
140
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EVOW
2008
Springer
15 years 8 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
136
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ISLPED
2007
ACM
15 years 8 months ago
2007
ACM
A 0.4-V UWB digital baseband processor has been fabricated in a standard-VT 90-nm CMOS technology. The baseband processor operates at an ultra-low supply voltage to reduce energy ...
143
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DAGSTUHL
2010
15 years 8 months ago
2010
Modeling complex organs, such as the human heart, requires a detailed understanding of the geometric and mechanical properties of that organ. Similarly, the model is only as accur...
178
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ESANN
2007
15 years 8 months ago
2007
Abstract. We propose a new algorithm for estimating the causal structure that underlies the observed dependence among n (n ≥ 4) binary variables X1, . . . , Xn. Our inference pri...
151
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EUSFLAT
2007
15 years 8 months ago
2007
In many regression learning algorithms for fuzzy rule bases it is not possible to define the error measure to be optimized freely. A possible alternative is the usage of global o...