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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
16 years 1 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
ACSAC
2007
IEEE
16 years 20 days ago
Tampering with Special Purpose Trusted Computing Devices: A Case Study in Optical Scan E-Voting
Special purpose trusted computing devices are currently being deployed to offer many services for which the general purpose computing paradigm is unsuitable. The nature of the ser...
Aggelos Kiayias, Laurent Michel, Alexander Russell...
AUSDM
2007
Springer
193views Data Mining» more  AUSDM 2007»
16 years 15 days ago
Are Zero-suppressed Binary Decision Diagrams Good for Mining Frequent Patterns in High Dimensional Datasets?
Mining frequent patterns such as frequent itemsets is a core operation in many important data mining tasks, such as in association rule mining. Mining frequent itemsets in high-di...
Elsa Loekito, James Bailey
CIKM
2008
Springer
15 years 8 months ago
Modeling hidden topics on document manifold
Topic modeling has been a key problem for document analysis. One of the canonical approaches for topic modeling is Probabilistic Latent Semantic Indexing, which maximizes the join...
Deng Cai, Qiaozhu Mei, Jiawei Han, Chengxiang Zhai
CIKM
2008
Springer
15 years 8 months ago
A heuristic approach for checking containment of generalized tree-pattern queries
Query processing techniques for XML data have focused mainly on tree-pattern queries (TPQs). However, the need for querying XML data sources whose structure is very complex or not...
Pawel Placek, Dimitri Theodoratos, Stefanos Soulda...